Internal Gate Resistance Tester

3041-R

The Tester 3041-R measures the internal gate resistance of MOSFET.
This tester is equipped with CONTACT CHECK and OPEN / SHORT test functions, and performs high volume production testing.

3041-R

Feature

  • Single or dual die MOSFET device test
  • N channel, P channel or combination device test
  • Standard Tester / Handler interface
  • Kelvin test with 100 mA constant current
  • Device Functional pre-test [Open/short]
  • Auto or Manual test operation
  • User-friendly interface, datalogging, program editor, and test summary
  • Networking capability (option)
  • Simple calibration procedure.
Parameter Range Resolution Unit
Internal gate resistance (Rg) 0.5 ~ 99.9 0.1 Ohms
Sine wave source 0.1 ~ 3.0 (1.0Vpp) 0.000365 MHz
DC constant current source 100 N/A mA
Input D.U.T. capacitance 400 ~ 20000 N/A pF
Test time 60 ~ 110 N/A ms

For details, please refer to the standard specification sheets of each product.

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