Film Frame Strip Test Handler / Map Sorter

4170-IH / 4605-HTR

4170-IH is Film Frame Strip Test handler for QFN and WLCSP. Devices are electrically isolated but keep the block state on the wafer ring and tested before being singulated to tray or tube.
The strip testing method is ideal solution for small (less than 3x3). very thin leadless device and has high flexibility for package conversion.

4605-HTR is a Tesec's latest High Speed MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by 4170-IH. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing and sorting process of leadless devices.

4170-IH
4605-HTR
MODEL 4170-IH 4605-HTR
Applicable Package QFN, DFN, CSP, BGA, BCC, LLP, WLCSP
Applicable Ring Size 8/12 inch
Applicable Device Size 0.6 x 0.6 ~ 8 x 8 0.5 x 0.5 ~ 8 x 8
Max Throughput(pc/h) 81,000 (based on 8 parallel) 30,000
Cycle Time (s/pc) 0.25 0.12 or less
Test Station Multi parallel -
Contactor Type Pogo pin, Customer Specified contactor -
Sort Category (Max) - Depend on device storing method
Feeding 1 cassette (25 wafer rings / 8 inch, 13 water rings / 12 inch)
Sorting 1 cassette
(25 wafer rings / 8 inch,
13 water rings / 12 inch)
Taping, Bin

For details, please refer to the standard specification sheets of each product.

Discrete Device Test System IPD/IPM Test System Single Function Test System Dynamic Test System MEMS Handler Map & Strip Handler Gravity Handler Specialty Handler Rotary Handler