Test System for Power Discrete Device
431-TT
The Model 431-TT is Tesec’s newest DC Parametric Test System which employs a new Architecture with V/I Source Measurement Modules.
The 431-TT is designed for Power Device testing and features high-speed test measurement and data capture, parallel device testing and an on-screen Waveform Monitor.
Feature
- VI Source Measure Modules Structure
- Measurable up to 1.2 kV per 130A
(maximum. 2.2 kV per 200A) on the main unit - High Speed Measurement
- Multi-device test (2 DUT simultaneous measurement of 2 in 1 devices and etc.)
- Wafer parallel test (2-chip simultaneous measurement)
- On Screen Waveform Monitor
- High Current Unit, High Voltage Unit as option
| Iteml | Specifications |
|---|---|
| Applicable Devices | Tr, FET, IGBT, Diode, Sic / GaN, etc. |
| Polarity | NPN / PNP, N / P Channel |
| Voltage | 1.2KV / 2.2kV (8kV as external option unit) |
| Current | 65A, For C-E 130A / 200A (1,200A as external option unit) |
| Test Mode / Analog Unit | 2 Parallel & 2 Serial (Max) |
| Number of Analog Unit | 2 (Max) |
| Test Item | 999 |
| Sort Item | 250 |
| Resolution (Bias) | 4 digits |
| Resolution (Measure) | 5 digits |
For details, please refer to the standard specification sheets of each product.
